SemiTek systems are designed primarily to test the electrical integrity of discrete semiconductor devices. If you have a need for a similar or specialty device, contact us. As new test requirements arise, SemiTek engineering is positioned to come up with the best solution. Let our engineers work with you to find the right solution.
PRODUCTS
Parametric Test Systems for your Discrete Semiconductors
Our systems feature complete parametric test solutions for . . .
Transistors | IGBT | SCR | Optocouplers | MOSFETS | Relays | Triacs | Sidacs | Arrays | JFet | Diodes
Series 4x
The 4x our newest and most anticipated system to come to market with test capability to 3000V and 200A. It is configured in a small, bench-top enclosure and is designed for high speed, production applications and an excellent choice for lab or testing house applications.
Series 201
The 201 extends its legacy into the next generation of ATE. The PC-based system has served the discrete semiconductor test industry for over twenty-five years in manufacturing and inspection.
The 201 is ideal for inspection and production applications where precision measurements and versatility are required.
Series 303
The 303 features a common platform for testing discrete devices of all types. The system is PC-based and configured in a bench-top enclosure with plug-in control cards dependent upon the application. Stimulus, measurement and switch matrix cards are designed to meet the specific need of the requirement.