The 4x is the next generation test system for discrete semiconductors. Designed with high volume production in mind, the system is also ideal for incoming or general purpose test applications.
The 4x is PC Windows based and linked to an embedded processor for uninterrupted test operations. Most devices can be tested in 300μs or less, in production applications with fully programmable voltage to 3000V and current to 200A.
Series 4x High-power, High-speed, Lower-cost Solution, Production-line Parametric Test System
There are two Source Measure Units (SMU) to stimulate or measure the Device Under Test (DUT). Both SMUs include a voltage and current source originating from the raw power supply and individual meters to make measurements.
The 4x SMUs are robust in design and can withstand long ON times. The 4x automatically detects when the source stimulus (voltage or current) is reached to sense the desired characteristic to measure and perform the test.
Each SMU source has its own Digital to Analog Converter (DAC) for controlling the amount of current and voltage specified for the DUT. Using proprietary circuitry, voltage and current can be held tightly to the programmed value. A high-speed switch matrix is used to switch in or out the SMUs to the DUT. See System Overview for complete specifications.
In SMU Ranges
Out SMU Ranges
*200mA max. **50V max.
Test operations are controlled from the 4x Dashboard at the PC, however a remote terminal controller is available for manual operation. A plug and play interface is provide for automated operations. Simply identify the signal paths and the 4x can communicate with virtually any automated prober.
The 4x Build Editor is used to create and edit a test procedure to verify the electrical parameters of your devices. In Build, a list of test symbols is displayed by device type and are easily added to a test procedure to build a list. Each parameter is edited for the specified test condition.